Corrigendum to "Spectroscopic ellipsometry characterization of polymer-fullerene blend films" [Thin Solid Films 517 (2008) 1047-1052] (DOI:10.1016/j.tsf.2008.05.038);Spectroscopic ellipsometry characterization of polymer-fullerene blend films

Thin Solid Films

Volumn 517, Issue 3, 2008, Pages 1047-1052

  Ng, A M C ^a   Cheung, K Y ^a   Fung, M K ^a   Djurisic A B ^a   Chan, W K ^a  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Polymers; Spectroscopic ellipsometry

Indexed keywords

ATOMIC FORCE MICROSCOPY; BUTYRIC ACID; OPTICAL PROPERTIES; ORGANIC SOLAR CELLS; PHASE SEPARATION; POLYMERS; SOLAR CELLS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE ROUGHNESS;

BLEND FILMS; DIFFERENT SOLVENTS; POLYMER-FULLERENE BLENDS; [6 ,6]-PHENYL-C61-BUTYRIC ACID METHYL ESTERS;

POLYMER FILMS;

EID: 56649112941     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.01.028     Document Type: Erratum

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