Exploring the potential of ellipsometry for the characterisation of electronic, optical, morphologic and thermodynamic properties of polyfluorene thin films

Synthetic Metals

Volumn 155, Issue 2, 2005, Pages 279-282

  Campoy Quiles, M ^a   Etchegoin, P G ^b   Bradley, D D C ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b VICTORIA UNIVERSITY OF WELLINGTON   (New Zealand)

Author keywords

Anisotropy; Conjugated polymers; Ellipsometry; IEVASE; PFO; Phase transitions

Indexed keywords

ANISOTROPY; APPROXIMATION THEORY; BIREFRINGENCE; ELLIPSOMETRY; FUNCTIONS; GLASS; LIGHT INTERFERENCE; MORPHOLOGY; ORGANIC POLYMERS; PHASE TRANSITIONS; REFRACTIVE INDEX; THERMODYNAMICS; THIN FILMS;

IEVASE; PFO; POLYFLUORENE; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY (VASE);

PLASTIC FILMS;

EID: 28544434587     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.synthmet.2005.01.031     Document Type: Conference Paper

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