On the determination of anisotropy in polymer thin films: A comparative study of optical techniques

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 5, Issue 5, 2008, Pages 1270-1273

  Campoy Quiles, M ^a   Nelson, J ^a   Etchegoin, P G ^a   Bradley, D D C ^a   Zhokhavets, V ^b   Gobsch, G ^b   Vaughan, H ^c   Monkman, A ^c   Inganas O ^d   Persson, N K ^d   Arwin, H ^d   Garriga, M ^e   Alonso, M I ^e   Herrmann, G ^f   Becker, M ^f,g   Scholdei, W ^f   Jahja, M ^f   Bubeck, C ^f  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^c DURHAM UNIVERSITY   (United Kingdom)

^d LINKÖPING UNIVERSITY   (Sweden)

^e CSIC   (Spain)

^f MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

^g FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; REFRACTIVE INDEX; SPECTROSCOPIC ANALYSIS; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS;

COMPARATIVE STUDIES; MULTIPLE SAMPLES; OPTICAL TECHNIQUE; POLYMER THIN FILMS; POLYVINYLCARBAZOLE; PRISM COUPLINGS; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY;

POLYMER FILMS;

EID: 77951134745     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200777835     Document Type: Conference Paper

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