Backside lift-out specimen preparation: Reversing the analysis direction in atom probe tomography

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 298-299

  Prosa, T J ^a   Lawrence, D ^a   Olson, D ^a   Larson, D J ^a   Marquis, E A ^b  

^a Imago Scientific Instruments   (United States)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949167955     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609093295     Document Type: Article

References (7)

1. J. H. Bunton et al., Micro. Microanal. 13 (2007) 418.
2. K. Thompson et al., Ultramicroscopy 107(2-3) (2006) 131.
3. D. J. Larson et al., Ultramicroscopy 79 (1999) 287.
4. D. Lawrence et al., Micro. Microanal. 14(Suppl 2) (2008) 1004.
5. F. Vurpillot et al., Micro. Microanal. 10(3) (2004) 384.
6. S. S. P. Parkin et al., Nature Materials 3 (2004) 862.
7. Dr. P. M. Rice, IBM Almaden, is gratefully acknowledged for providing of the materials.