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Volumn 11, Issue 2, 2011, Pages 493-497
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Observation of hole accumulation in Ge/Si core/shell nanowires using off-axis electron holography
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Author keywords
Core shell nanowires; hole accumulation; off axis electron holography
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Indexed keywords
CORE REGION;
CORE/SHELL;
CORE/SHELL NANOWIRES;
CYLINDRICAL MODELS;
DARK-FIELD;
ELECTRON HOLOGRAMS;
HOLE ACCUMULATION;
HOLE DENSITIES;
MICROSCOPY TECHNIQUE;
OFF-AXIS;
OFF-AXIS ELECTRON HOLOGRAPHY;
SCANNING TRANSMISSION ELECTRON MICROSCOPY;
SI(111) SUBSTRATE;
VAPOR-LIQUID-SOLID GROWTH MECHANISM;
CHEMICAL VAPOR DEPOSITION;
ELECTRON HOLOGRAPHY;
GERMANIUM;
HOLOGRAMS;
NANOWIRES;
TRANSMISSION ELECTRON MICROSCOPY;
ELECTRONS;
GERMANIUM;
NANOMATERIAL;
SILICON;
ARTICLE;
CHEMISTRY;
CONFORMATION;
CRYSTALLIZATION;
ELECTRON MICROSCOPY;
HOLOGRAPHY;
MACROMOLECULE;
MATERIALS TESTING;
METHODOLOGY;
NANOTECHNOLOGY;
PARTICLE SIZE;
POROSITY;
SURFACE PROPERTY;
ULTRASTRUCTURE;
CRYSTALLIZATION;
GERMANIUM;
HOLOGRAPHY;
MACROMOLECULAR SUBSTANCES;
MATERIALS TESTING;
MICROSCOPY, ELECTRON;
MOLECULAR CONFORMATION;
NANOSTRUCTURES;
NANOTECHNOLOGY;
PARTICLE SIZE;
POROSITY;
SILICON;
SURFACE PROPERTIES;
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EID: 79851484268
PISSN: 15306984
EISSN: 15306992
Source Type: Journal
DOI: 10.1021/nl1033107 Document Type: Article |
Times cited : (50)
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References (16)
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