Resistively shunted YBa2Cu3O7 grain boundary junctions and low-noise SQUIDs patterned by a focused ion beam down to 80 nm linewidth

Superconductor Science and Technology

Volumn 24, Issue 1, 2011, Pages

  Nagel, J ^a   Konovalenko, K B ^a   Kemmler, M ^a   Turad, M ^a   Werner, R ^a   Kleisz, E ^b   Menzel, S ^b   Klingeler, R ^b   Buchner B ^b   Kleiner, R ^a   Koelle, D ^b  

^a UNIVERSITY OF TÜBINGEN   (Germany)

^b IFW DRESDEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BICRYSTAL GRAIN BOUNDARY; CRITICAL CURRENT DENSITIES J; DC SQUID; FABRICATION PROCESS; FLUX NOISE; FOCUSED ION BEAM MILLING; GRAIN BOUNDARY JUNCTIONS; JUNCTION AREA; JUNCTION RESISTANCES; LOW NOISE; MAGNETIC PARTICLE; NANO SCALE; ORDER OF MAGNITUDE; SPIN SYSTEMS;

FOCUSED ION BEAMS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MAGNETIC FLUX; MAGNETIC MOMENTS; SEMICONDUCTOR JUNCTIONS; SPECTRAL DENSITY; SPIN DYNAMICS; WHITE NOISE;

NANOMAGNETICS;

EID: 79551606964     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/24/1/015015     Document Type: Article

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