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Volumn 106, Issue 3, 1994, Pages 265-269
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Comparative study of shunted bicrystal Josephson junctions
b a,c a,d a |
Author keywords
74.50.+r; 74.76.Bz; 85.25.Cp; 85.25.Jw
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Indexed keywords
CALCULATIONS;
CRYSTAL STRUCTURE;
ELECTRIC CONDUCTIVITY;
ELECTRIC CONTACTS;
ELECTRIC RESISTANCE;
EVAPORATION;
GRAIN BOUNDARIES;
INTERFACES (MATERIALS);
NUMERICAL METHODS;
OPTIMIZATION;
PERFORMANCE;
THIN FILMS;
CONTACT RESISTIVITY;
GOLD CONTACT;
INTERMITTENT THERMAL COEVAPORATION;
JUNCTION SHUNT RESISTANCE;
SERIES ARRAY;
SHUNTED BICRYSTALS;
JOSEPHSON JUNCTION DEVICES;
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EID: 0031078355
PISSN: 00222291
EISSN: 15737357
Source Type: Journal
DOI: 10.1007/BF02399624 Document Type: Article |
Times cited : (8)
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References (9)
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