Measurement and noise performance of nano-superconducting-quantum- interference devices fabricated by focused ion beam

Applied Physics Letters

Volumn 92, Issue 19, 2008, Pages

  Hao, L ^a   MacFarlane, J C ^a   Gallop, J C ^a   Cox, D ^a   Beyer, J ^b   Drung, D ^b   Schurig, T ^b  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FOCUSED ION BEAMS; MAGNETIC FLUX; NEMS; PHOTOLITHOGRAPHY; SIGNAL NOISE MEASUREMENT;

FOCUSED ION BEAM PATTERNING; NOISE PERFORMANCE;

SQUIDS;

EID: 44049090783     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2917580     Document Type: Article

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