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Volumn 18, Issue SUPPL. 1, 2007, Pages 343-346

Thickness-dependent optical properties of ZnO thin films

Author keywords

[No Author keywords available]

Indexed keywords

FILTERED CATHODIC VACUUM ARC (FCVA) METHOD; STRUCTURAL DISORDER; URBACH TAIL PARAMETER;

BUFFER LAYERS; FILM THICKNESS; OPTICAL BAND GAPS; OPTICAL PROPERTIES; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS;

ZINC OXIDE;

EID: 34547597718 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-007-9243-3 Document Type: Conference Paper

Times cited : (27)

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