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Volumn 3, Issue 3, 2008, Pages 104-113

Die attach film performance in 3D QFN stacked die

Author keywords

Delamination; Die attach film; QFN

Indexed keywords

3-DIMENSIONAL; ACOUSTIC TESTING; BONDING CONDITIONS; BONDING TEMPERATURES; CHARACTERISATION; CONSUMER DEMANDS; DIE ATTACH; DIE ATTACH FILM; DIE ATTACH PROCESS; DIE STACKING; FILM PERFORMANCE; INTERFACIAL DELAMINATION; IT PERFORMANCE; KEY TECHNOLOGIES; MECHANICAL ADHESION; MOISTURE SENSITIVITY LEVEL; QFN; RELIABILITY PERFORMANCE; SCANNING CALORIMETRY; SEMICONDUCTOR INDUSTRIES; SHEAR TESTING; THERMAL RESISTANCE;

EID: 78651555762     PISSN: 19918747     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (8)

References (12)
  • 4
    • 0034480160 scopus 로고    scopus 로고
    • Novel Die Attach Films Having High Reliability Performance for Lead-free Solder and CSP
    • S. Takeda and T. Masuko, Novel Die Attach Films Having High Reliability Performance for Lead-free Solder and CSP, Electronic Components and Technology Conference, 2000, pp. 1616-1622.
    • (2000) Electronic Components and Technology Conference , pp. 1616-1622
    • Takeda, S.1    Masuko, T.2
  • 5
    • 0030675907 scopus 로고    scopus 로고
    • S. Takeda, T. Masuko, Y. Miyadera, M. Yamazaki and I. Maekawa, A Novel Die Bonding Adhesive-Silver Filled Film, Electronic Components and Technology Conference, 4, 1997, pp. 518-524.
    • S. Takeda, T. Masuko, Y. Miyadera, M. Yamazaki and I. Maekawa, A Novel Die Bonding Adhesive-Silver Filled Film, Electronic Components and Technology Conference, Vol.4, 1997, pp. 518-524.
  • 7
    • 84945243987 scopus 로고    scopus 로고
    • A Study on the Characteristic of UV cured Die-attach Films In Stack CSP (Chip Scale Package)
    • C. L. Chung and S. L. Fu, A Study on the Characteristic of UV cured Die-attach Films In Stack CSP (Chip Scale Package), International Conference on Microelectronics, 2003, pp. 365-368.
    • (2003) International Conference on Microelectronics , pp. 365-368
    • Chung, C.L.1    Fu, S.L.2
  • 12
    • 78651533039 scopus 로고    scopus 로고
    • J-STD-020C Joint IPC/JEDEC Standard for Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface-Mount Devices Jul 2004
    • J-STD-020C Joint IPC/JEDEC Standard for Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface-Mount Devices (Jul 2004).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.