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Volumn 2, Issue , 2005, Pages 848-852

Die attach film application in multi die stack package

Author keywords

[No Author keywords available]

Indexed keywords

BONDING; DIES; PRODUCTIVITY; RHEOLOGY; SILICON WAFERS;

EID: 33847311393     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (26)

References (7)
  • 2
    • 33847324022 scopus 로고    scopus 로고
    • Joint IPC/JEDEC Standard for Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface-Mount Devices
    • Jul
    • J-STD-020C. Joint IPC/JEDEC Standard for Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface-Mount Devices, Jul 2004
    • (2004) J-STD-020C
  • 3
    • 33847308679 scopus 로고    scopus 로고
    • Semiconductor Divison, Die Attach Materials -Technical Data Presentation, Hitachi Chemical Co., Ltd (Japan, 2005), pp.2-6
    • Semiconductor Divison, Die Attach Materials -Technical Data Presentation, Hitachi Chemical Co., Ltd (Japan, 2005), pp.2-6
  • 7
    • 33847337440 scopus 로고    scopus 로고
    • th International, Jul. 2004, pp. 68-73
    • th International, Jul. 2004, pp. 68-73


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.