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Volumn 71, Issue 4, 1996, Pages 2155-2157

Imaging the internal and external pore structure of membranes in fluid: TappingMode scanning ion conductance microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ATOMIC FORCE MICROSCOPY; IMAGE QUALITY; ION CONDUCTANCE; ION CURRENT; MEMBRANE CONDUCTANCE; MEMBRANE STRUCTURE; MICROPIPETTE; SENSOR;

EID: 0029818020     PISSN: 00063495     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0006-3495(96)79416-X     Document Type: Article
Times cited : (77)

References (10)
  • 8
    • 36549096102 scopus 로고
    • Novel optical approach to atomic force microscopy
    • Meyer, G., and N. M. Amer. 1988. Novel optical approach to atomic force microscopy. Appl. Phys. Lett. 53:1045-1047.
    • (1988) Appl. Phys. Lett. , vol.53 , pp. 1045-1047
    • Meyer, G.1    Amer, N.M.2
  • 9
    • 21544432308 scopus 로고
    • Improved scanning-ion conductance microscope using microfabricated probes
    • Prater, C. B., P. K. Hansma, M. Tortonese, and C. F. Quate. 1991. Improved scanning-ion conductance microscope using microfabricated probes. Rev. Sci. Instrum. 62:2634-2638.
    • (1991) Rev. Sci. Instrum. , vol.62 , pp. 2634-2638
    • Prater, C.B.1    Hansma, P.K.2    Tortonese, M.3    Quate, C.F.4
  • 10
    • 0027610690 scopus 로고
    • Fractured polymer/silica fiber surface imaged studied by TappingMode atomic force microscopy
    • Zhong, Q., D. Inniss, K. Kjoller, and V. B. Elings. 1993. Fractured polymer/silica fiber surface imaged studied by TappingMode atomic force microscopy. Surf. Sci. 290:L688-L692.
    • (1993) Surf. Sci. , vol.290
    • Zhong, Q.1    Inniss, D.2    Kjoller, K.3    Elings, V.B.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.