Metal-insulator transition and electrically driven memristive characteristics of SmNiO3 thin films

Applied Physics Letters

Volumn 98, Issue 1, 2011, Pages

  Ha, Sieu D ^a   Aydogdu, Gulgun H ^a   Ramanathan, Shriram ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSPORT; ELECTRON TRANSPORT; IN-PLANE; INSULATOR-TO-METAL TRANSITIONS; MEMRISTIVE BEHAVIOR; MIXED OXIDE; NEUROMORPHIC; OUT-OF-PLANE; X-RAY DIFFRACTION STUDIES;

METAL INSULATOR BOUNDARIES; SEMICONDUCTOR INSULATOR BOUNDARIES; SINGLE CRYSTALS; TEMPERATURE MEASUREMENT; X RAY DIFFRACTION;

METAL INSULATOR TRANSITION;

EID: 78651289434     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3536486     Document Type: Article

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