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V eq, CV eq, CI eq. This certainly holds for substitutional dopants
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2 layer deposited formerly. Experiments with P-implanted samples capped with silicon nitride shown in this work reduce the P dose loss to about 10% (40%) at 500° (680°) and do not reveal a retarded diffusion under irradiation
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2 layer deposited formerly. Experiments with P-implanted samples capped with silicon nitride shown in this work reduce the P dose loss to about 10% (40%) at 500° (680°) and do not reveal a retarded diffusion under irradiation.
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