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Volumn 98, Issue 1, 2011, Pages

Suppression of donor-vacancy clusters in germanium by concurrent annealing and irradiation

Author keywords

[No Author keywords available]

Indexed keywords

DOPANT PROFILE; DOPING LEVELS; IN-SITU; INTERSTITIALS; PENETRATION DEPTH; THEORETICAL SIMULATION; THERMAL EQUILIBRIUMS; VACANCY CLUSTER; VACANCY CONCENTRATION;

EID: 78651275993     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3534791     Document Type: Article
Times cited : (21)

References (24)
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    • Simoen, E.1    Vanhellemont, J.2
  • 12
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    • (2010) J. Appl. Phys. , vol.107 , pp. 076102
    • Chroneos, A.1
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    • 33846283038 scopus 로고    scopus 로고
    • 0556-2805,. 10.1103/PhysRevB.75.035210
    • H. Bracht, Phys. Rev. B 0556-2805 75, 035210 (2007). 10.1103/PhysRevB.75. 035210
    • (2007) Phys. Rev. B , vol.75 , pp. 035210
    • Bracht, H.1
  • 18
    • 39349099747 scopus 로고    scopus 로고
    • 0021-8979,. 10.1063/1.2837103
    • S. Brotzmann and H. Bracht, J. Appl. Phys. 0021-8979 103, 033508 (2008). 10.1063/1.2837103
    • (2008) J. Appl. Phys. , vol.103 , pp. 033508
    • Brotzmann, S.1    Bracht, H.2
  • 20
    • 78651327423 scopus 로고    scopus 로고
    • V eq, CV eq, CI eq. This certainly holds for substitutional dopants
    • V eq, CV eq, CI eq. This certainly holds for substitutional dopants.
  • 24
    • 78651311883 scopus 로고    scopus 로고
    • 2 layer deposited formerly. Experiments with P-implanted samples capped with silicon nitride shown in this work reduce the P dose loss to about 10% (40%) at 500° (680°) and do not reveal a retarded diffusion under irradiation
    • 2 layer deposited formerly. Experiments with P-implanted samples capped with silicon nitride shown in this work reduce the P dose loss to about 10% (40%) at 500° (680°) and do not reveal a retarded diffusion under irradiation.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.