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JOM

Volumn 62, Issue 12, 2010, Pages 44-51

Rrevealing plastic deformation mechanisms in polycrystalline thin films with synchrotron XRD

(3) Nyilas, Ralph D a Frank, Stephan a Spolenak, Ralph a

a ETH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION TWIN; DEFORMATION TWINNING; FACE-CENTERED CUBIC; IN-SITU SYNCHROTRONS; MACROSCOPIC YIELD; MICRO-ELECTRONIC DEVICES; PLASTIC DEFORMATION MECHANISMS; POLYCRYSTALLINE; POLYCRYSTALLINE THIN FILM; SIZE EFFECTS; SUBGRAIN STRUCTURES; THIN GOLD FILM; THIN METAL FILMS; THIN SILVER FILMS; UNIAXIAL DEFORMATION; XRD;

METALLIC FILMS; MICROELECTRONICS; PLASTIC DEFORMATION; SYNCHROTRONS; YIELD STRESS;

SILVER;

EID: 78650898240 PISSN: 10474838 EISSN: 15431851 Source Type: Journal
DOI: 10.1007/s11837-010-0179-3 Document Type: Article

Times cited : (5)

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