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Applied Physics Letters

Volumn 97, Issue 25, 2010, Pages

Enhanced force sensitivity and noise squeezing in an electromechanical resonator coupled to a nanotransistor

(5) Mahboob, I a Flurin, E a Nishiguchi, K a Fujiwara, A a Yamaguchi, H a

a NTT Basic Research Laboratories (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFICATION SCHEME; DISPLACEMENT NOISE; ELECTRICAL SIGNAL; ELECTROMECHANICAL RESONATORS; FORCE LEVEL; FORCE SENSITIVITY; MECHANICAL DISPLACEMENTS; NANO TRANSISTORS; NOISE-SQUEEZING; THERMOMECHANICAL NOISE;

CRYSTALLOGRAPHY; MESFET DEVICES; MICROWAVE AMPLIFIERS; PARAMETRIC AMPLIFIERS; RESONATORS; THERMOMECHANICAL TREATMENT;

ELECTROMECHANICAL DEVICES;

EID: 78650729582 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3528454 Document Type: Article

Times cited : (18)

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