Nanomechanical motion measured with an imprecision below that at the standard quantum limit

Nature Nanotechnology

Volumn 4, Issue 12, 2009, Pages 820-823

  Teufel, J D ^a   Donner, T ^a   Castellanos Beltran, M A ^a   Harlow, J W ^a   Lehnert, K W ^a  

^a UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISPLACEMENT MEASUREMENT; INTERFEROMETERS; MICROWAVE OSCILLATORS; OSCILLATORS (MECHANICAL); QUANTUM THEORY;

CRITICAL STEPS; CRYOGENIC TEMPERATURES; FORCE DETECTORS; MICROWAVE INTERFEROMETER; NANOMECHANICAL MOTION; NANOMECHANICAL OSCILLATORS; STANDARD QUANTUM LIMITS; ULTRA SENSITIVES;

SHOT NOISE;

ACCURACY; ARTICLE; FORCE; INTERFEROMETRY; MASS; MEASUREMENT; MOLECULAR MECHANICS; MOTION; OSCILLATOR; PRIORITY JOURNAL; QUANTUM MECHANICS; SENSITIVITY ANALYSIS; STANDARD; TEMPERATURE; THERMAL ANALYSIS;

EID: 72549089377     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2009.343     Document Type: Article

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