-
1
-
-
7444220645
-
-
SCIEAS 0036-8075 10.1126/science.1102896
-
K.S. Novoselov, Science 306, 666 (2004). SCIEAS 0036-8075 10.1126/science.1102896
-
(2004)
Science
, vol.306
, pp. 666
-
-
Novoselov, K.S.1
-
2
-
-
33744469329
-
-
SCIEAS 0036-8075 10.1126/science.1125925
-
C. Berger, Science 312, 1191 (2006). SCIEAS 0036-8075 10.1126/science.1125925
-
(2006)
Science
, vol.312
, pp. 1191
-
-
Berger, C.1
-
3
-
-
43049170468
-
-
SSCOA4 0038-1098 10.1016/j.ssc.2008.02.024
-
K.I. Bolotin, Solid State Commun. 146, 351 (2008). SSCOA4 0038-1098 10.1016/j.ssc.2008.02.024
-
(2008)
Solid State Commun.
, vol.146
, pp. 351
-
-
Bolotin, K.I.1
-
4
-
-
49449091072
-
-
1748-3387 10.1038/nnano.2008.199
-
X. Du, Nature Nanotech. 1748-3387 3, 491 (2008). 10.1038/nnano.2008.199
-
(2008)
Nature Nanotech.
, vol.3
, pp. 491
-
-
Du, X.1
-
5
-
-
34547334459
-
-
PRLTAO 0031-9007 10.1103/PhysRevLett.98.206805
-
M.Y. Han, Phys. Rev. Lett. 98, 206805 (2007). PRLTAO 0031-9007 10.1103/PhysRevLett.98.206805
-
(2007)
Phys. Rev. Lett.
, vol.98
, pp. 206805
-
-
Han, M.Y.1
-
6
-
-
36048991480
-
-
PELNFM 1386-9477 10.1016/j.physe.2007.06.020
-
Z. Chen, Y.M. Lin, M.J. Rooks, and P. Avouris, Physica E (Amsterdam) PELNFM 1386-9477 40, 228 (2007). 10.1016/j.physe.2007.06.020
-
(2007)
Physica e (Amsterdam)
, vol.40
, pp. 228
-
-
Chen, Z.1
Lin, Y.M.2
Rooks, M.J.3
Avouris, P.4
-
7
-
-
40049093097
-
-
SCIEAS 0036-8075 10.1126/science.1150878
-
X. Li, Science 319, 1229 (2008). SCIEAS 0036-8075 10.1126/science.1150878
-
(2008)
Science
, vol.319
, pp. 1229
-
-
Li, X.1
-
9
-
-
57349090160
-
-
1748-3387 10.1038/nnano.2008.268
-
I. Meric, Nature Nanotech. 1748-3387 3, 654 (2008). 10.1038/nnano.2008. 268
-
(2008)
Nature Nanotech.
, vol.3
, pp. 654
-
-
Meric, I.1
-
10
-
-
65849394132
-
-
SSCOA4 0038-1098 10.1016/j.ssc.2009.02.039
-
P. Blake, Solid State Commun. 149, 1068 (2009). SSCOA4 0038-1098 10.1016/j.ssc.2009.02.039
-
(2009)
Solid State Commun.
, vol.149
, pp. 1068
-
-
Blake, P.1
-
11
-
-
51749110481
-
-
PRBMDO 1098-0121 10.1103/PhysRevB.78.121402
-
B. Huard, Phys. Rev. B PRBMDO 1098-0121 78, 121402 (2008). 10.1103/PhysRevB.78.121402
-
(2008)
Phys. Rev. B
, vol.78
, pp. 121402
-
-
Huard, B.1
-
12
-
-
17944383013
-
-
PRLTAO 0031-9007 10.1103/PhysRevLett.84.2941
-
Z. Yao, C.L. Kane, and C. Dekker, Phys. Rev. Lett. 84, 2941 (2000). PRLTAO 0031-9007 10.1103/PhysRevLett.84.2941
-
(2000)
Phys. Rev. Lett.
, vol.84
, pp. 2941
-
-
Yao, Z.1
Kane, C.L.2
Dekker, C.3
-
13
-
-
6344225229
-
-
PRLTAO 0031-9007 10.1103/PhysRevLett.92.026804
-
B. Bourlon, Phys. Rev. Lett. 92, 026804 (2004). PRLTAO 0031-9007 10.1103/PhysRevLett.92.026804
-
(2004)
Phys. Rev. Lett.
, vol.92
, pp. 026804
-
-
Bourlon, B.1
-
15
-
-
50849092565
-
-
PRBMDO 1098-0121 10.1103/PhysRevB.78.081406
-
M. Lazzeri, Phys. Rev. B PRBMDO 1098-0121 78, 081406(R) (2008). 10.1103/PhysRevB.78.081406
-
(2008)
Phys. Rev. B
, vol.78
-
-
Lazzeri, M.1
-
16
-
-
33646237377
-
-
PRBMDO 1098-0121 10.1103/PhysRevB.73.165419
-
M. Lazzeri and F. Mauri, Phys. Rev. B PRBMDO 1098-0121 73, 165419 (2006). 10.1103/PhysRevB.73.165419
-
(2006)
Phys. Rev. B
, vol.73
, pp. 165419
-
-
Lazzeri, M.1
Mauri, F.2
-
17
-
-
35548990688
-
-
PRLTAO 0031-9007 10.1103/PhysRevLett.99.176802
-
N. Bonini, Phys. Rev. Lett. 99, 176802 (2007). PRLTAO 0031-9007 10.1103/PhysRevLett.99.176802
-
(2007)
Phys. Rev. Lett.
, vol.99
, pp. 176802
-
-
Bonini, N.1
-
18
-
-
28844492067
-
-
PRLTAO 0031-9007 10.1103/PhysRevLett.95.236802
-
M. Lazzeri, Phys. Rev. Lett. 95, 236802 (2005). PRLTAO 0031-9007 10.1103/PhysRevLett.95.236802
-
(2005)
Phys. Rev. Lett.
, vol.95
, pp. 236802
-
-
Lazzeri, M.1
-
19
-
-
43149118786
-
-
NPAHAX 1745-2481 10.1038/nphys935
-
J.H. Chen, Nature Phys. 4, 377 (2008). NPAHAX 1745-2481 10.1038/nphys935
-
(2008)
Nature Phys.
, vol.4
, pp. 377
-
-
Chen, J.H.1
-
20
-
-
43549126200
-
-
PRBMDO 1098-0121 10.1103/PhysRevB.77.195412
-
E.H. Hwang and D. Das Sarma, Phys. Rev. B PRBMDO 1098-0121 77, 195412 (2008). Charged impurities are located at zi=1nm from graphene, and the environment dielectric constant is κ=2.5. 10.1103/PhysRevB.77.195412
-
(2008)
Phys. Rev. B
, vol.77
, pp. 195412
-
-
Hwang, E.H.1
Das Sarma, D.2
-
21
-
-
47549105501
-
-
We use the relaxation time approximation with the scattering time reported in APPLAB 0003-6951 10.1063/1.2956669
-
We use the relaxation time approximation with the scattering time reported in W.K. Tse, E.H. Hwang, and S. Das Sarma, Appl. Phys. Lett. 93, 023128 (2008) and imposing particle, energy, and momentum conservation. The electron-electron scattering does not affect the zero-voltage conductivity and increases the high-field current only by up to 4% at Vg=±24 Volt. APPLAB 0003-6951 10.1063/1.2956669
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 023128
-
-
Tse, W.K.1
Hwang, E.H.2
Das Sarma, S.3
-
22
-
-
47949124921
-
-
PRLTAO 0031-9007 10.1103/PhysRevLett.101.036808
-
A. Lherbier, Phys. Rev. Lett. 101, 036808 (2008); PRLTAO 0031-9007 10.1103/PhysRevLett.101.036808
-
(2008)
Phys. Rev. Lett.
, vol.101
, pp. 036808
-
-
Lherbier, A.1
-
23
-
-
55849127772
-
-
PRLTAO 0031-9007 10.1103/PhysRevLett.101.196803
-
J.P. Robinson, Phys. Rev. Lett. 101, 196803 (2008). PRLTAO 0031-9007 10.1103/PhysRevLett.101.196803
-
(2008)
Phys. Rev. Lett.
, vol.101
, pp. 196803
-
-
Robinson, J.P.1
-
24
-
-
41549086591
-
-
PRLTAO 0031-9007 10.1103/PhysRevLett.100.127401
-
M. Oron-Carl and R. Krupke, Phys. Rev. Lett. 100, 127401 (2008). PRLTAO 0031-9007 10.1103/PhysRevLett.100.127401
-
(2008)
Phys. Rev. Lett.
, vol.100
, pp. 127401
-
-
Oron-Carl, M.1
Krupke, R.2
-
25
-
-
63149197720
-
-
PRLTAO 0031-9007 10.1103/PhysRevLett.102.105501
-
V.V. Deshpande, Phys. Rev. Lett. 102, 105501 (2009). PRLTAO 0031-9007 10.1103/PhysRevLett.102.105501
-
(2009)
Phys. Rev. Lett.
, vol.102
, pp. 105501
-
-
Deshpande, V.V.1
|