Hot phonons in an electrically biased graphene constriction

Nano Letters

Volumn 10, Issue 2, 2010, Pages 466-471

  Chae, Dong Hun ^a   Krauss, Benjamin ^a   Von Klitzing, Klaus ^a   Smet, Jurgen H ^a  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

Electron phonon coupling; Graphene; Hot phonons; Joule heating; Raman spectroscopy

Indexed keywords

BAND GAPS; CARRIER INTERACTIONS; DEVICE PERFORMANCE; ELECTRON PHONON COUPLINGS; ELECTRON-HOLE GENERATION; ELECTRONIC DEVICE; FERMI TEMPERATURE; GRAPHENES; HOT PHONONS; INTERACTION STRENGTH; LOW CARRIER DENSITY; PHONON LIFETIMES; SEMI-METALS; SIGNIFICANT IMPACTS; TEMPERATURE DEPENDENT; TEMPERATURE REGIMES;

ELECTRON CORRELATIONS; ELECTRON-PHONON INTERACTIONS; ELECTRONS; ENERGY DISSIPATION; GRAPHENE; GRAPHITE; HEATING; JOULE HEATING; RAMAN SCATTERING; RAMAN SPECTROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 76749134375     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl903167f     Document Type: Article

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