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Journal of Materials Chemistry

Volumn 21, Issue 3, 2011, Pages 743-751

Atomic layer deposition of CdxZn1-xS films

(5) Bakke, Jonathan R a Tanskanen, Jukka T a,b Jung, Hee Joon a Sinclair, Robert a Bent, Stacey F a

a Stanford University (United States)

b UNIVERSITY OF EASTERN FINLAND (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM; CADMIUM SULFIDE; ENERGY GAP; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; II-VI SEMICONDUCTORS; REFRACTIVE INDEX; SULFUR COMPOUNDS; ZINC SULFIDE;

BINARY FILMS; CADMIUM CONTENT; DEPOSITED FILMS; DFT CALCULATION; HIGH RESOLUTION; INDEX OF REFRACTION; RELATIVE RATIOS; ZINC-BLENDE;

ATOMIC LAYER DEPOSITION;

EID: 78650461644 PISSN: 09599428 EISSN: 13645501 Source Type: Journal
DOI: 10.1039/c0jm02786c Document Type: Article

Times cited : (26)

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