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Volumn 83, Issue 9, 2009, Pages 1645-1651
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Preparation and characterization of CdxZn1-xS thin films by spray pyrolysis technique for photovoltaic applications
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Author keywords
EDAX; SEM; Semiconductor thin films; Spray pyrolysis; UV VIS spectrophotometer; XRD
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Indexed keywords
EDAX;
SEM;
SEMICONDUCTOR THIN FILMS;
UV-VIS SPECTROPHOTOMETER;
XRD;
CADMIUM;
CHEMICAL ANALYSIS;
CRACKING (CHEMICAL);
DIFFRACTION;
ENERGY GAP;
INDICATORS (CHEMICAL);
INFRARED SPECTROPHOTOMETERS;
METEOROLOGICAL INSTRUMENTS;
SEMICONDUCTING CADMIUM COMPOUNDS;
SEMICONDUCTING SELENIUM COMPOUNDS;
SPECTROPHOTOMETERS;
SPECTROPHOTOMETRY;
STRUCTURAL PROPERTIES;
THERMOGRAVIMETRIC ANALYSIS;
THIN FILMS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
ZINC;
ZINC SULFIDE;
SPRAY PYROLYSIS;
APPLIED SCIENCE;
ELECTRONIC EQUIPMENT;
EXPERIMENTAL STUDY;
FILM;
OPTICAL PROPERTY;
PHOTOVOLTAIC SYSTEM;
PYROLYSIS;
SUBSTRATE;
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EID: 67651119961
PISSN: 0038092X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.solener.2009.06.004 Document Type: Article |
Times cited : (52)
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References (28)
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