Atomic layer deposition of CdS films

Chemistry of Materials

Volumn 22, Issue 16, 2010, Pages 4669-4678

  Bakke, Jonathan R ^a   Jung, Hee Joon ^a   Tanskanen, Jukka T ^a,b   Sinclair, Robert ^a   Bent, Stacey F ^a  

^a Stanford University   (United States)

^b UNIVERSITY OF EASTERN FINLAND   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE GRAIN SIZE; BAND GAPS; CDS; CDS FILMS; CRYSTAL PLANES; CYCLE NUMBER; DENSITY FUNCTIONAL THEORY CALCULATIONS; DIMETHYL CADMIUM; IN-SITU; LINEAR GROWTH RATE; POLYCRYSTALLINE; SATURATION BEHAVIOR; SELECTED AREA DIFFRACTION PATTERNS; SI(1 0 0); TRANSMISSION ELECTRON MICROSCOPY IMAGES; WURTZITES; ZINC-BLENDE;

ATOMIC FORCE MICROSCOPY; ATOMIC LAYER DEPOSITION; CADMIUM; CADMIUM COMPOUNDS; CADMIUM SULFIDE; CRYSTAL STRUCTURE; DENSITY FUNCTIONAL THEORY; DIFFRACTION; ENERGY GAP; GROWTH RATE; HOLOGRAPHIC INTERFEROMETRY; SCANNING ELECTRON MICROSCOPY; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET SPECTROSCOPY; ULTRAVIOLET VISIBLE SPECTROSCOPY; X RAY DIFFRACTION; ZINC SULFIDE;

ATOMS;

EID: 77955703131     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm100874f     Document Type: Article

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