Selecting the tip electron orbital for scanning tunneling microscopy imaging with sub-ångström lateral resolution

Europhysics Letters

Volumn 92, Issue 4, 2010, Pages

  Chaika, A N ^a   Nazin, S S ^a   Semenov, V N ^a   Bozhko, S I ^a,b   Lubben O ^b   Krasnikov, S A ^b   Radican, K ^b   Shvets, I V ^b  

^a INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

^b TRINITY COLLEGE DUBLIN   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 78650405555     PISSN: 02955075     EISSN: 12864854     Source Type: Journal    
DOI: 10.1209/0295-5075/92/46003     Document Type: Article

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