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Volumn 57, Issue 61, 2010, Pages 1811-1815
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Optical, electrical, and structural properties of ultrathin Zirconium-oxide films
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Author keywords
Annealing; Ellipsometry; High k; Tauc Lorentz
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Indexed keywords
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EID: 78650356453
PISSN: 03744884
EISSN: None
Source Type: Journal
DOI: 10.3938/jkps.57.1811 Document Type: Article |
Times cited : (6)
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References (14)
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