SCOPUS 정보 검색 플랫폼

Journal of Materials Chemistry

Volumn 21, Issue 2, 2011, Pages 432-438

Oriented silver oxide nanostructures synthesized through a template-free electrochemical route

(4) Wei, Weifeng a Mao, Xuhui a Ortiz, Luis A a Sadoway, Donald R a

a Massachusetts Institute of Technology Cambridge (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS ZONES; AQUEOUS SOLUTIONS; AREAL DENSITIES; COLUMNAR STRUCTURES; CONDUCTIVE SUBSTRATES; DEPOSITION PARAMETERS; ELECTROCHEMICAL PROCESS; ELECTROCHEMICAL ROUTES; ELECTRODE/ELECTROLYTE INTERFACES; KINETIC EFFECT; MORPHOLOGICAL FEATURES; NANODISKS; OXIDE NANOSTRUCTURES; POLYCRYSTALLINE; SILVER NITRATES; SINGLE-CRYSTALLINE; SOLUTION PH; SUPERSATURATION RATIO; TEMPLATE-FREE; TRANSITION-METAL OXIDES; TWIN BOUNDARIES; XPS;

AMORPHOUS MATERIALS; CHEMICAL ANALYSIS; NANOSTRUCTURES; OXIDES; SILVER OXIDES; STACKING FAULTS; TRANSITION METAL COMPOUNDS; TRANSITION METALS;

SILVER;

EID: 78650313802 PISSN: 09599428 EISSN: 13645501 Source Type: Journal
DOI: 10.1039/c0jm02214d Document Type: Article

Times cited : (115)

References (39)

1
- 24644471925
- J. F. Pierson C. Rousselot Surf. Coat. Technol. 2005 200 276
- (2005) Surf. Coat. Technol. , vol.200 , pp. 276
- Pierson, J.F.¹ Rousselot, C.²

2
- 0000568228
- J. F. Weaver G. B. Hoflund J. Phys. Chem. 1994 98 8519
- (1994) J. Phys. Chem. , vol.98 , pp. 8519
- Weaver, J.F.¹ Hoflund, G.B.²

3
- 0037096526
- M. Bielmann P. Schwaller P. Ruffieux O. Groning L. Schlapbach P. Groning Phys. Rev. B: Condens. Matter Mater. Phys. 2002 65 235431
- (2002) Phys. Rev. B: Condens. Matter Mater. Phys. , vol.65 , pp. 235431
- Bielmann, M.¹ Schwaller, P.² Ruffieux, P.³ Groning, O.⁴ Schlapbach, L.⁵ Groning, P.⁶

4
- 0019552041
- N. Yamamoto S. Tonomura T. Matsuoka H. Tsubomura Jpn. J. Appl. Phys. 1981 20 721
- (1981) Jpn. J. Appl. Phys. , vol.20 , pp. 721
- Yamamoto, N.¹ Tonomura, S.² Matsuoka, T.³ Tsubomura, H.⁴

5
- 28144443213
- B. J. Murray Q. Li J. T. Newberg E. J. Menke J. C. Hemminger R. M. Penner Nano Lett. 2005 5 2319
- (2005) Nano Lett. , vol.5 , pp. 2319
- Murray, B.J.¹ Li, Q.² Newberg, J.T.³ Menke, E.J.⁴ Hemminger, J.C.⁵ Penner, R.M.⁶

6
- 30744452249
- B. J. Murray Q. Li J. T. Newberg E. J. Menke J. C. Hemminger R. M. Penner Chem. Mater. 2005 17 6611
- (2005) Chem. Mater. , vol.17 , pp. 6611
- Murray, B.J.¹ Li, Q.² Newberg, J.T.³ Menke, E.J.⁴ Hemminger, J.C.⁵ Penner, R.M.⁶

7
- 23744488584
- B. J. Murray J. T. Newberg E. C. Walter Q. Li J. C. Hemminger R. M. Penner Anal. Chem. 2005 77 5205
- (2005) Anal. Chem. , vol.77 , pp. 5205
- Murray, B.J.¹ Newberg, J.T.² Walter, E.C.³ Li, Q.⁴ Hemminger, J.C.⁵ Penner, R.M.⁶

8
- 0022677421
- E. Tselepis E. Fortin J. Mater. Sci. 1986 21 985
- (1986) J. Mater. Sci. , vol.21 , pp. 985
- Tselepis, E.¹ Fortin, E.²

9
- 40549131646
- Y. Ida S. Watase T. Shinagawa M. Watanabe M. Chigane M. Inaba A. Tasaka M. Izaki Chem. Mater. 2008 20 1254
- (2008) Chem. Mater. , vol.20 , pp. 1254
- Ida, Y.¹ Watase, S.² Shinagawa, T.³ Watanabe, M.⁴ Chigane, M.⁵ Inaba, M.⁶ Tasaka, A.⁷ Izaki, M.⁸

10
- 0030246607
- B. E. Breyfogle C. Hung M. G. Shumsky J. A. Switzer J. Electrochem. Soc. 1996 143 2741
- (1996) J. Electrochem. Soc. , vol.143 , pp. 2741
- Breyfogle, B.E.¹ Hung, C.² Shumsky, M.G.³ Switzer, J.A.⁴

11
- 4043064179
- Y. Her Y. Lan W. Hsu S. Y. Tsai J. Appl. Phys. 2004 96 1283
- (2004) J. Appl. Phys. , vol.96 , pp. 1283
- Her, Y.¹ Lan, Y.² Hsu, W.³ Tsai, S.Y.⁴

12
- 0038722139
- J. Tominaga J. Phys.: Condens. Matter 2003 15 R1101
- (2003) J. Phys.: Condens. Matter , vol.15 , pp. 1101
- Tominaga, J.¹

13
- 0021477656
- W. A. Parkhurst S. Dallek B. F. Larrick J. Electrochem. Soc. 1984 131 1739
- (1984) J. Electrochem. Soc. , vol.131 , pp. 1739
- Parkhurst, W.A.¹ Dallek, S.² Larrick, B.F.³

14
- 0022983693
- S. Dallek W. A. West B. F. Larrick J. Electrochem. Soc. 1986 133 2451
- (1986) J. Electrochem. Soc. , vol.133 , pp. 2451
- Dallek, S.¹ West, W.A.² Larrick, B.F.³

15
- 0037868562
- D. Buchel C. Mihalcea T. Fukaya N. Atoda J. Tominaga T. Kikuwa H. Fuji Appl. Phys. Lett. 2001 79 620
- (2001) Appl. Phys. Lett. , vol.79 , pp. 620
- Buchel, D.¹ Mihalcea, C.² Fukaya, T.³ Atoda, N.⁴ Tominaga, J.⁵ Kikuwa, T.⁶ Fuji, H.⁷

16
- 0001580436
- S. Haratani J. Tominaga H. Dohi S. Takayama J. Appl. Phys. 1994 76 1297
- (1994) J. Appl. Phys. , vol.76 , pp. 1297
- Haratani, S.¹ Tominaga, J.² Dohi, H.³ Takayama, S.⁴

17
- 0035356629
- T. Fukaya D. Buchel S. Shinbori J. Tominaga N. Atoda D. P. Tsai W. Lin J. Appl. Phys. 2001 89 6139
- (2001) J. Appl. Phys. , vol.89 , pp. 6139
- Fukaya, T.¹ Buchel, D.² Shinbori, S.³ Tominaga, J.⁴ Atoda, N.⁵ Tsai, D.P.⁶ Lin, W.⁷

18
- 5044252549
- S. S. Djokic R. E. Burrell N. Le D. J. Field J. Electrochem. Soc. 2001 148 C191
- (2001) J. Electrochem. Soc. , vol.148 , pp. 191
- Djokic, S.S.¹ Burrell, R.E.² Le, N.³ Field, D.J.⁴

19
- 0041509241
- Y. Chiu U. Rambabu M. Hsu H. Shieh C. Y. Chin H. H. Lin J. Appl. Phys. 2003 94 1996
- (2003) J. Appl. Phys. , vol.94 , pp. 1996
- Chiu, Y.¹ Rambabu, U.² Hsu, M.³ Shieh, H.⁴ Chin, C.Y.⁵ Lin, H.H.⁶

20
- 0037937244
- T. Shima J. Tominaga J. Vac. Sci. Technol., A 2003 21 634
- (2003) J. Vac. Sci. Technol., A , vol.21 , pp. 634
- Shima, T.¹ Tominaga, J.²

21
- 5044248801
- Y. Abe T. Hasegawa M. Kawamura K. Sasaki Vacuum 2004 76 1
- (2004) Vacuum , vol.76 , pp. 1
- Abe, Y.¹ Hasegawa, T.² Kawamura, M.³ Sasaki, K.⁴

22
- 1842476965
- A. V. Kolobov A. Rogalev F. Wilhelm N. Jaouen T. Shima J. Tominaga Appl. Phys. Lett. 2004 84 1641
- (2004) Appl. Phys. Lett. , vol.84 , pp. 1641
- Kolobov, A.V.¹ Rogalev, A.² Wilhelm, F.³ Jaouen, N.⁴ Shima, T.⁵ Tominaga, J.⁶

23
- 14644402457
- J. F. Pierson D. Wiederkehr A. Billard Thin Solid Films 2005 478 196
- (2005) Thin Solid Films , vol.478 , pp. 196
- Pierson, J.F.¹ Wiederkehr, D.² Billard, A.³

24
- 29144436362
- T. Arai C. Rockstuhl P. Fons K. Kurihara T. Nakano K. Awazu J. Tominaga Nanotechnology 2006 17 79
- (2006) Nanotechnology , vol.17 , pp. 79
- Arai, T.¹ Rockstuhl, C.² Fons, P.³ Kurihara, K.⁴ Nakano, T.⁵ Awazu, K.⁶ Tominaga, J.⁷

25
- 0030219328
- A. A. Schmidt J. Offermann R. Anton Thin Solid Films 1996 281-282 105
- (1996) Thin Solid Films , vol.281-282 , pp. 105
- Schmidt, A.A.¹ Offermann, J.² Anton, R.³

26
- 0032473217
- S. M. Hou M. Ouyang H. F. Chen W. M. Liu Z. Q. Xue Q. D. Wu H. X. Zhang H. J. Gao S. J. Pang Thin Solid Films 1998 315 322
- (1998) Thin Solid Films , vol.315 , pp. 322
- Hou, S.M.¹ Ouyang, M.² Chen, H.F.³ Liu, W.M.⁴ Xue, Z.Q.⁵ Wu, Q.D.⁶ Zhang, H.X.⁷ Gao, H.J.⁸ Pang, S.J.⁹

27
- 34250003743
- K. Byrappa T. Adschiri Prog. Cryst. Growth Charact. Mater. 2007 53 117
- (2007) Prog. Cryst. Growth Charact. Mater. , vol.53 , pp. 117
- Byrappa, K.¹ Adschiri, T.²

28
- 33947410026
- X. M. Chen M. L. Tong Acc. Chem. Res. 2007 40 162
- (2007) Acc. Chem. Res. , vol.40 , pp. 162
- Chen, X.M.¹ Tong, M.L.²

29
- 0004195211
- G. Hodes, Wiley-Vch, Weinheim
- J. A. Switzer, in Electrochemistry of Nanomaterials: Preparations and Properties, ed., G. Hodes, Wiley-Vch, Weinheim, 2001, p. 67
- (2001) Electrochemistry of Nanomaterials: Preparations and Properties , pp. 67
- Switzer, J.A.¹

30
- 0016576251
- J. S. Hammond S. W. Gaarenstroom N. Winograd Anal. Chem. 1975 47 2193
- (1975) Anal. Chem. , vol.47 , pp. 2193
- Hammond, J.S.¹ Gaarenstroom, S.W.² Winograd, N.³

31
- 0003459529
- Perkin-Elmer Corp., Eden Prairie, MN
- J. Chastain, Handbook of X-Ray Photoelectron Spectroscopy, Perkin-Elmer Corp., Eden Prairie, MN, 1992
- (1992) Handbook of X-Ray Photoelectron Spectroscopy
- Chastain, J.¹

32
- 0037096526
- M. Bielmann P. Schwaller P. Ruffieux O. Groning L. Schlapbach P. Groning Phys. Rev. B: Condens. Matter Mater. Phys. 2002 65 235431
- (2002) Phys. Rev. B: Condens. Matter Mater. Phys. , vol.65 , pp. 235431
- Bielmann, M.¹ Schwaller, P.² Ruffieux, P.³ Groning, O.⁴ Schlapbach, L.⁵ Groning, P.⁶

33
- 78650371660
- International Center for Diffraction Data, Newtown Square, PA
- JCPDS, International Center for Diffraction Data, Newtown Square, PA, 2001
- (2001) JCPDS

34
- 34547544185
- W. F. Wei W. X. Chen D. G. Ivey J. Phys. Chem. C 2007 111 10398
- (2007) J. Phys. Chem. C , vol.111 , pp. 10398
- Wei, W.F.¹ Chen, W.X.² Ivey, D.G.³

35
- 84932599554
- Cambridge University Press, Cambridge
- I. Sunagawa, Crystals Growth, Morphology and Perfection, Cambridge University Press, Cambridge, 2005
- (2005) Crystals Growth, Morphology and Perfection
- Sunagawa, I.¹

36
- 0000114128
- S. C. Hill J. I. D. Alexander Phys. Rev. E: Stat. Phys., Plasmas, Fluids, Relat. Interdiscip. Top. 1997 56 4317
- (1997) Phys. Rev. E: Stat. Phys., Plasmas, Fluids, Relat. Interdiscip. Top. , vol.56 , pp. 4317
- Hill, S.C.¹ Alexander, J.I.D.²

37
- 0141516676
- D. B. Wang M. S. Mo D. B. Yu L. Q. Xu F. Q. Li Y. T. Qian Cryst. Growth Des. 2003 3 717
- (2003) Cryst. Growth Des. , vol.3 , pp. 717
- Wang, D.B.¹ Mo, M.S.² Yu, D.B.³ Xu, L.Q.⁴ Li, F.Q.⁵ Qian, Y.T.⁶

38
- 4143051486
- Y. H. Ni H. J. Liu F. Wang Y. Y. Liang J. M. Hong X. Ma Z. Xu Cryst. Growth Des. 2004 4 759
- (2004) Cryst. Growth Des. , vol.4 , pp. 759
- Ni, Y.H.¹ Liu, H.J.² Wang, F.³ Liang, Y.Y.⁴ Hong, J.M.⁵ Ma, X.⁶ Xu, Z.⁷

39
- 77149169103
- X. Wang H. F. Wu Q. Kuang R. B. Huang Z. X. Xie L. S. Zheng Langmuir 2010 26 2774
- (2010) Langmuir , vol.26 , pp. 2774
- Wang, X.¹ Wu, H.F.² Kuang, Q.³ Huang, R.B.⁴ Xie, Z.X.⁵ Zheng, L.S.⁶

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.