Effect of constituent phases of reactively sputtered AgOx film on recording and readout mechanisms of super-resolution near-field structure disk

Journal of Applied Physics

Volumn 96, Issue 3, 2004, Pages 1283-1288

  Her, Yung Chsun ^a   Lan, Yuh Chang ^a   Hsu, Wei Chih ^b   Tsai, Song Yeu ^b  

^a NATIONAL CHUNG HSING UNIVERSITY   (Taiwan)

^b INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTOMETERS; LASER PULSES; LASER RECORDING; LIGHT SCATTERING; MAGNETRON SPUTTERING; MATHEMATICAL MODELS; OPTICAL DISK STORAGE; OPTICAL RESOLVING POWER; READOUT SYSTEMS; SCANNING ELECTRON MICROSCOPY; SILVER COMPOUNDS; SURFACE PLASMON RESONANCE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

GRAZING INCIDENT X-RAY DIFFRACTOMETER (GIXD); OPTIMAL WRITING POWER; READOUT MECHANISMS; SUPER-RESOLUTION NEAR-FIELD STRUCTURE (SUPER-RENS) DISK;

OPTICAL FILMS;

EID: 4043064179     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1767978     Document Type: Article

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