|
Volumn 65, Issue 23, 2002, Pages 2354311-2354315
|
AgO investigated by photoelectron spectroscopy: Evidence for mixed valence
a a a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
SILICON DIOXIDE;
SILVER DERIVATIVE;
ARTICLE;
BINDING AFFINITY;
CALCULATION;
CHEMICAL ANALYSIS;
CRYSTAL;
CRYSTALLOGRAPHY;
MEASUREMENT;
PHYSICS;
PROTON NUCLEAR MAGNETIC RESONANCE;
ROOM TEMPERATURE;
X RAY PHOTOELECTRON SPECTROSCOPY;
|
EID: 0037096526
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevB.65.235431 Document Type: Article |
Times cited : (101)
|
References (29)
|