Reversible resistance modulation in mesoscopic silver wires induced by exposure to amine vapor

Analytical Chemistry

Volumn 77, Issue 16, 2005, Pages 5205-5214

  Murray, B J ^a   Newberg, J T ^a   Walter, E C ^a   Li, Q ^a   Hemminger, J C ^a   Penner, R M ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMINES; AMMONIA; ELECTROCHEMISTRY; HYDROCHLORIC ACID; LIGHT SCATTERING; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; REACTION KINETICS; SEMICONDUCTOR MATERIALS; SILVER; THERMAL EFFECTS; WIRE;

PYRIDINE; REVERSIBLE RESISTANCE MODULATION; SILVER NANOWIRES (AGNE); TRIMETHYLAMINE;

ELECTRIC RESISTANCE MEASUREMENT;

AMINE; ARGON; CARBON MONOXIDE; HYDROCARBON; METAL; NANOWIRE; NITROGEN; OXYGEN; SILVER; WATER;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRIC RESISTANCE; ELECTROCHEMISTRY; ELECTRODE; ENERGY; GAS; MEASUREMENT; NANOTECHNOLOGY; OXIDATION; SCANNING ELECTRON MICROSCOPY; SENSOR; SPECTROMETER; TRANSMISSION ELECTRON MICROSCOPY; VAPOR; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 23744488584     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac050636e     Document Type: Article

References (44)

1. Cui, Y.; Wei, Q. Q.; Park, H. K.; Lieber, C. M. Science 2001, 293, 1289-1292.
2. Hahm, J.; Lieber, C. M. Nano Lett. 2004, 4, 51-54.
3. Holzapfel, C.; Akemann, W.; Schumacher, D.; Otto, A. Surf. Sci. 1990, 227, 123-128.
4. Holzapfel, C.; Stubenrauch, F.; Schumacher, D.; Otto, A. Thin Solid Films 1990, 188, 7-19.
5. Hsu, C. L.; McCullen, E. F.; Tobin, R. G. Chem. Phys. Lett. 2000, 316, 336-342.
6. Lin, K. C.; Tobin, R. G.; Dumas, P.; Hirschmugl, C. J.; Williams, G. P. Phys. Rev. B 1993, 48, 2791-2794.
7. Tobin, R. G. Phys. Rev. B 1993, 48, 15468-15470.
8. Tobin, R. G. Surf. Sci. 2002, 502, 374-387.
9. Winkes, H.; Schumacher, D.; Otto, A. Surf. Sci. 1998, 400, 44-53.
10. Wissmann, P., Ed. Thin Metal Films and Gas Chemisorption; Elseview:New York, 1987.
11. Zhang, Y.; Terrill, R. H.; Bohn, P. W. Anal. Chem. 1999, 71, 119-125.
12. Zhang, Y.; Terrill, R. H.; Bohn, P. W. J. Am. Chem. Soc. 1998, 120, 9969-9970.
13. Zhang, Y. M.; Terrill, R. H.; Bohn, P. W. Anal. Chem. 1999, 71, 119-125.
14. Li, C. Z.; H. S.; Tao, N. J. Phys. Rev. B 1998, 58, 6775-6778.
15. He, H. X.; Tao, N. J. Adv. Mater. 2002, 14, 161-+.
16. Bogozi, A.; Lam, O.; He, H. X.; Li, C. Z.; Tao, N. J.; Nagahara, L. A.; Amlani, L; Tsui, R. J. Am. Chem. Soc. 2001, 123, 4585-4590.
17. Li, C. Z.; He, H. X.; Bogozi, A.; Bunch, J. S.; Tao, N. J. Appl. Phys. Lett. 2000, 76, 1333-1335.
18. Walter, E. C.; Favier, F.; Penner, R. M. Anal. Chem. 2002, 74, 1546-1553.
19. Favier, F.; Walter, E. C.; Zach, M. P.; Benter, T.; Penner, R. M. Science 2001, 293, 2227-2231.
20. Murray, B. J.; Walter, E. C.; Penner, R. M. Nano Lett. 2004, 4, 665-670.
21. Examples include: PotraSens II (Analytical Technologies Inc., Collegeville, PA), which can detect 0-500 ppm, Pac III (Drager Safety Inc. Leubeck, Germany), which can detect 0-200 ppm, ToxiPro (biosystems, Middletown, CT) can detect 0-100 ppm, and R.M. Technologies Inc. (Mt. Laurel, NJ), which can detect 0-20 000 ppm. "Zero" here is taken to be the limit of detection for the sensor, which is in the 10-25 ppm range in all cases. The response times for these sensors are in the 20-45-s range (T90).
22. The step edges exploited for nanowire growth are those that are naturally present on these ZYB-grade HOPG surfaces after cleaving with adhesive tape.
23. Walter, E. C.; Murray, B. J.; Favier, F.; Kaltenpoth, G.; Grunze, M.; Penner, R. M. J. Phys. Chem. Soc. 2002, 106, 11407-11411.
24. Zach, M. P.; Ng, K. H.; Penner, R. M. Science 2000, 290, 2120-2123.
25. Cabrera, A. L.; AguayoSoto, R. Catal. Lett. 1997, 45, 79-83.
26. Cabrera, A. L.; Garrido-Molina, W.; Morales-Leal, E.; Espinosa-Gangas, J. Langmuir 1998, 14, 3249-3254.
27. Cabrera, A. L.; GarridoMolina, W.; Colino, J.; Lederman, D.; Schuller, I. K. Phys. Rev. B 1997, 55, 13999-14004.
28. Cabrera, A. L.; Morales, E.; Hasen, J.; Schuller, I. K. Appl. Phys. Lett. 1995, 66, 1216-1218.
29. Fried, G. A.; Zhang, Y. M.; Bohn, P. W. Thin Solid Films 2001, 401, 171-178.
30. Krastev, E. T.; Kuhl, D. E.; Tobin, R. G. Surf. Sci. 1997, 387, L1051-L1056.
31. Lusk, A. L.; Bohn, P. W. J. Phys. Chem. Soc. 2001, 105, 462-470.
32. McCullen, E. F.; Hsu, C. L.; Tobin, R G. Surf. Sci. 2001, 481, 198-204.
33. Calvert, J. Copper, SIlver, Gold; The University of Denver Press: Denver, CO, 2002.
34. -5, and 12 Ω·cm.
35. Tjeng, L. H.; Meinders, M. B. J.; Vanelp, J.; Ghijsen, J.; Sawatzky, G. A.; Johnson, R. L. Phys Rev B 1990, 41, 3190-3199.
36. Farhut, E.; Donnadieu, A.; Robin, J. Thin Solid Films 1975, 29, 319.
37. Dirkes, T. P. J. Electrochem. Soc. 1959, 106, 920.
38. Wales, C. P.; Burbank, J. J. Electrochem. Soc. 1959, 106, 885.
39. Kotz, R.; Yeager, E. J. Electroanal. Chem. 1980, 111, 105-110.
40. XPS has a 0.1% atomic resolution. This corresponds to ∼196 of a monojayer (ML). For the samples probed here, electrodeposited silver wires cover ∼20% of the graphite surface area. Thus, the limit of detection for oxide on the silver nanowires is approximately 1.0%/20% = 5.0% ML.
41. Hammond, J. S.; Gaarenstroom, S. W.; Winograd, N. Anal. Chem. 1975, 47, 2193-2199.
42. Sander, R. Compilation of Henry's Law Constants for Inorganic and Organic Species of Potential Importance in Environmental Chemistry; 1999, publisher, http://www.mpch-mainz.mpg.de/~sander/res/henry.html.
43. Chastain, J. Handbook of X-ray Photoelectron Spectroscopy, Perkin-Elmer Corp.: Eden Prairie, MN, 1992.
44. Bielmann, M.; Schwaller, P.; Ruffieux, P.; Groning, O.; Schlapbach, L.; Groning, P. Phys. Rev. B 2002, 65, -.