Quality control using luminescence imaging in production of mcsilicon solar cells from UMG feedstock

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2010, Pages 812-816

  Haunschild, Jonas ^a   Glatthaar, Markus ^a   Riepe, Stephan ^a   Rein, Stefan ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CELL EFFICIENCY; CELL PROCESS; COMPENSATION EFFECTS; CONDUCTANCE DECAYS; CRYSTALLIZATION PROCESS; ELECTRONIC GRADE; FRAUNHOFER; I - V CURVE; INDUSTRIAL SOLAR CELLS; LUMINESCENCE IMAGING; MEASUREMENT TECHNIQUES; MULTICRYSTALLINE; PHOTOLUMINESCENCE IMAGING;

BRICK; BRICKMAKING; BUILDING MATERIALS; FEEDSTOCKS; PHOTOVOLTAIC EFFECTS; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; SOLAR CELLS;

PROCESS CONTROL;

EID: 78650126081     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2010.5617202     Document Type: Conference Paper

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