Quantitative analysis of localized surface plasmons based on molecular probing

ACS Nano

Volumn 4, Issue 8, 2010, Pages 4579-4586

  Deeb, Claire ^a   Bachelot, Renaud ^a   Plain, Jérôme ^a   Baudrion, Anne Laure ^a   Jradi, Safi ^a   Bouhelier, Alexandre ^b   Soppera, Olivier ^c   Jain, Prashant K ^d   Huang, Libai ^e   Ecoffet, Carole ^c   Balan, Lavinia ^c   Royer, Pascal ^a  

^a UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

^b UNIVERSITÉ DE BOURGOGNE   (France)

^c UNIVERSITÉ DE HAUTE ALSACE   (France)

^d UNIVERSITY OF CALIFORNIA   (United States)

^e UNIVERSITY OF NOTRE DAME   (United States)

Author keywords

Localized surface plasmon quantitative analysis nanoscale photopolymerization; Molecular probes; Near field optics

Indexed keywords

ENHANCEMENT FACTOR; LOCALIZED SURFACE PLASMON; MOLECULAR PROBES; NANO SCALE; NEAR-FIELD; NEAR-FIELD DISTRIBUTION; NEAR-FIELD OPTICS; OPTICAL NEAR FIELD; PHOTO-ACTIVATED; PLASMONIC; QUANTITATIVE ANALYSIS; QUANTITATIVE CHARACTERIZATION; SINGLE NANOPARTICLE; SPECTRAL SIGNATURE;

ELECTROMAGNETIC FIELDS; NANOPARTICLES; NANOPHOTONICS; NANOSTRUCTURED MATERIALS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL DATA STORAGE; PHOTOPOLYMERIZATION; PLASMONS; PROBES;

SURFACE PLASMON RESONANCE;

EID: 78650084621     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn101017b     Document Type: Article

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