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Volumn 8, Issue 3, 2008, Pages 935-940

Short range plasmon resonators probed by photoemission electron microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE POLARIZATION; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; LASER EXCITATION; NANORODS; PHOTOEMISSION; SURFACE PLASMON RESONANCE; SURFACE PLASMONS;

EID: 61449090541     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl080053v     Document Type: Article
Times cited : (135)

References (33)
  • 2
    • 20444375479 scopus 로고    scopus 로고
    • Greffet, J. J. Science 2005, 308, 1561-1562.
    • (2005) Science , vol.308 , pp. 1561-1562
    • Greffet, J.J.1
  • 3
  • 22
    • 61449168273 scopus 로고    scopus 로고
    • The lateral resolution is defined by the horizontal distance over which the intensity drops from 84% to 16% of maximum signal
    • The lateral resolution is defined by the horizontal distance over which the intensity drops from 84% to 16% of maximum signal.
  • 23
    • 61449174166 scopus 로고    scopus 로고
    • The current LEEM/PEEM instrument works in total electron yield which increases its sensitivity at the price of a loss of spatial resolution originating from the energy spread of the electrons contributing to the image formation chromatic aberration
    • The current LEEM/PEEM instrument works in total electron yield which increases its sensitivity at the price of a loss of spatial resolution originating from the energy spread of the electrons contributing to the image formation (chromatic aberration).
  • 29
    • 61449160515 scopus 로고    scopus 로고
    • s. More details can be found in ref 28.
    • s. More details can be found in ref 28.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.