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1
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0032625408
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M. Colburn, S. Johnson, M. Stewart, S. Damle, T. Bailey, B. Choi, M. Wedlake, T. Michaelson, S. V. Sreenivasan, J. Ekerdt, and C. G. Willson, Proc. SPIE, Emerging Lithographic Technologies III, 379 (1999).
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Colburn, M.1
Johnson, S.2
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Bailey, T.5
Choi, B.6
Wedlake, M.7
Michaelson, T.8
Sreenivasan, S.V.9
Ekerdt, J.10
Willson, C.G.11
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2
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78649823667
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June
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M. Colburn, T. Bailey, B. J. Choi, J. G. Ekerdt, S. V. Sreenivasan, Solid State Technology, 67, June 2001.
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Solid State Technology
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Colburn, M.1
Bailey, T.2
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Ekerdt, J.G.4
Sreenivasan, S.V.5
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3
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4243591197
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T. C. Bailey, D. J. Resnick, D. Mancini, K. J. Nordquist, W. J. Dauksher, E. Ainley, A. Talin, K. Gehoski, J. H. Baker, B. J. Choi, S. Johnson, M. Colburn, S. V. Sreenivasan, J. G. Ekerdt, and C. G. Willson, Microelectronic Engineering 61-62 (2002) 461-467.
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Microelectronic Engineering
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Bailey, T.C.1
Resnick, D.J.2
Mancini, D.3
Nordquist, K.J.4
Dauksher, W.J.5
Ainley, E.6
Talin, A.7
Gehoski, K.8
Baker, J.H.9
Choi, B.J.10
Johnson, S.11
Colburn, M.12
Sreenivasan, S.V.13
Ekerdt, J.G.14
Willson, C.G.15
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4
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62649143642
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R. S. Sasaki, T. Hiraka, J. Mizuochi, A. Fujii, Y. Sakai, T. Sutou, S. Yusa, K. Kuriyama, M. Sakaki, Y. Morikawa, H. Mohri, N. Hayashi, Proc. SPIE Vol. 7122, 71223P (2008).
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Sasaki, R.S.1
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Kuriyama, K.8
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Morikawa, Y.10
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Hayashi, N.12
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5
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78649894335
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presented at
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S.V. Sreenivasan, P. Schumaker, B. Mokaberi-Nezhad, J. Choi, J. Perez, V. Truskett, F. Xu, X, Lu, presented at the SPIE Advanced Lithography Symposium, Conference 7271, 2009.
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The SPIE Advanced Lithography Symposium, Conference 7271
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Sreenivasan, S.V.1
Schumaker, P.2
Mokaberi-Nezhad, B.3
Choi, J.4
Perez, J.5
Truskett, V.6
Xu, F.7
Lu, X.8
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6
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42149139643
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K. Selenidis, J. Maltabes, I. McMackin, J. Perez, W. Martin, D. J. Resnick, S.V. Sreenivasan, Proc. SPIE Vol. 6730, 67300F-1, 2007.
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Proc. SPIE
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Selenidis, K.1
Maltabes, J.2
McMackin, I.3
Perez, J.4
Martin, W.5
Resnick, D.J.6
Sreenivasan, S.V.7
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7
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3843107899
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I. McMackin, J. Choi, P. Schumaker, V. Nguyen, F. Xu, E. Thompson, D. Babbs, S. V. Sreenivasan, M. Watts, and N. Schumaker, Proc. SPIE 5374, 222 (2004).
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Proc. SPIE
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McMackin, I.1
Choi, J.2
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Nguyen, V.4
Xu, F.5
Thompson, E.6
Babbs, D.7
Sreenivasan, S.V.8
Watts, M.9
Schumaker, N.10
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8
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78649853840
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January
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D. Convey, P. Fejes, Y. Wei, K. Gehosky, W. J. Dauksher, D. P. Mancini, K. Nordquist, K. Palmer, D. J. Resnick, Microscopy and Analysis, 13, January 2006.
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Microscopy and Analysis
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Convey, D.1
Fejes, P.2
Wei, Y.3
Gehosky, K.4
Dauksher, W.J.5
Mancini, D.P.6
Nordquist, K.7
Palmer, K.8
Resnick, D.J.9
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9
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77953315483
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G. M. Schmid, C. Brooks, Z. Ye, S. Johnson, D. LaBrake, S. V. Sreenivasan, and D. J. Resnick, Proc. SPIE 7488, 748820 (2009).
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(2009)
Proc. SPIE
, vol.7488
, pp. 748820
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Schmid, G.M.1
Brooks, C.2
Ye, Z.3
Johnson, S.4
LaBrake, D.5
Sreenivasan, S.V.6
Resnick, D.J.7
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10
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77953298999
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Z. Ye, R. Ramos, C. B. Brooks, P. Hellebrekers, S. Carden, D. LaBrake, SPIE 7637, 76371A (2010).
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(2010)
SPIE 7637
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Ye, Z.1
Ramos, R.2
Brooks, C.B.3
Hellebrekers, P.4
Carden, S.5
LaBrake, D.6
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11
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77953305689
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D. J. Resnick, G. Haase, L. Singh; D. Curran, G. M. Schmid, K. Luo, C. Brooks, K. Selinidis, J. Fretwell, S. V. Sreenivasan, SPIE 7637, 76370R (2010).
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(2010)
SPIE 7637
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Resnick, D.J.1
Haase, G.2
Singh, L.3
Curran, D.4
Schmid, G.M.5
Luo, K.6
Brooks, C.7
Selinidis, K.8
Fretwell, J.9
Sreenivasan, S.V.10
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