A grazing incidence small-angle x-ray scattering analysis on capped Ge nanodots in layer structures

Journal of Physics Condensed Matter

Volumn 22, Issue 47, 2010, Pages

  Okuda, Hiroshi ^a   Kato, Masayuki ^a   Kuno, Keiji ^a   Ochiai, Shojiro ^a   Usami, Noritaka ^b   Nakajima, Kazuo ^b   Sakata, Osami ^c  

^a KYOTO UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

^c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DISTORTED WAVE BORN APPROXIMATION; GI-SAXS; GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING; KINEMATIC ANALYSIS; LAYER STRUCTURES; NANODOTS; REFLECTIVITY ANALYSIS;

BORN APPROXIMATION; GERMANIUM; HIGH ENERGY PHYSICS; QUANTUM THEORY; SOLIDS;

X RAY SCATTERING;

GERMANIUM; NANOPARTICLE;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; METHODOLOGY; SURFACE PROPERTY; ULTRASTRUCTURE; X RAY DIFFRACTION;

COMPUTER SIMULATION; GERMANIUM; MODELS, CHEMICAL; NANOPARTICLES; SURFACE PROPERTIES; X-RAY DIFFRACTION;

EID: 78649876671     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/22/47/474003     Document Type: Article

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