Grazing-incidence small-angle scattering measurement of Ge islands capped with a Si layer

Applied Physics Letters

Volumn 81, Issue 13, 2002, Pages 2358-2360

  Okuda, Hiroshi ^a   Ochiai, Shojiro ^a   Ito, Kazuki ^b   Amemiya, Yoshiyuki ^c  

^a KYOTO UNIVERSITY   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

A-SI LAYERS; AVERAGE DISTANCE; AVERAGE SIZE; CAP LAYERS; GE ISLAND; GI-SAXS; GRAZING INCIDENCE; NANODOTS; SMALL-ANGLE SCATTERING;

PHYSICAL PROPERTIES; PHYSICS;

GERMANIUM;

EID: 79956047146     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1509112     Document Type: Article

References (7)

1. D. J. Eagelsham and M. Cerullo, Phys. Rev. Lett. 64, 1943 (1990). prl PRLTAO 0031-9007
2. F. M. Ross, J. Tersoff, and R. M. Tromp, Phys. Rev. Lett. 80, 984 (1998). prl PRLTAO 0031-9007
3. D. Binberg, M. Grundmann, and N. N. Ledentsov, Quantum Dot Heterostructures (Wiley, New York, 1999).
4. J. Stangl, V. Holý, T. Roch, A. Daniel, G. Bauer, J. Zhu, K. Brunner, and G. Abstreiter, Phys. Rev. B 62, 7229 (2000). prb PRBMDO 0163-1829
5. A. Naudon, in Modern Techniques in Small-angle Scattering, edited by Brumberger (Kluwer, Dordrecht, 1993), p. 181.
6. M. Rauscher, R. Paniago, H. Metzger, Z. Kovats, J. Domke, J. Peisl, H.-D. Pfannes, J. Schulze, and I. Eisele, J. Appl. Phys. 86, 6763 (1999). jap JAPIAU 0021-8979
7. S. K. Sinha, E. B. Sirota, S. Garoff, and H. B. Stanley, Phys. Rev. B 38, 2297 (1988). prb PRBMDO 0163-1829