Application of grazing-incidence small-angle X-ray scattering technique to semiconducting composite materials

Materials Science Forum

Volumn 475-479, Issue II, 2005, Pages 1097-1100

  Ogawa, T ^a   Niwa, H ^a   Okuda, H ^a   Ochiai, S ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

GI SAXS; Quantum dots; Si Ge

Indexed keywords

ATOMIC FORCE MICROSCOPY; MORPHOLOGY; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR QUANTUM DOTS; SUBSTRATES; SYNCHROTRONS; X RAY SCATTERING;

CLUSTERS; GI-SAXS; ISLAND DENSITY; NANODOTS; SI-GE;

COMPOSITE MATERIALS;

EID: 17044431816     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-960-1.1097     Document Type: Conference Paper

References (7)

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