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Volumn 347, Issue , 2000, Pages 95-100
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High energy microscope for local strain measurements within bulk materials
a b a a |
Author keywords
[No Author keywords available]
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Indexed keywords
METAL TESTING;
MICROSCOPES;
NONDESTRUCTIVE EXAMINATION;
POLYCRYSTALLINE MATERIALS;
SCANNING;
SYNCHROTRON RADIATION;
THERMOMECHANICAL TREATMENT;
X RAY DIFFRACTION ANALYSIS;
CROSSED-BEAM TECHNIQUE;
MACROSTRAIN MEASUREMENT;
MICROSTRAIN MEASUREMENT;
STRAIN SCANNING;
STRAIN MEASUREMENT;
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EID: 0033676032
PISSN: 02555476
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (19)
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References (9)
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