Streak camera in standard (Bi)CMOS (Bipolar complementary metal-oxide-semiconductor) technology

Measurement Science and Technology

Volumn 21, Issue 11, 2010, Pages

  Zlatanski, M ^a   Uhring, W ^a   Le Normand, J P ^a   Zint, C V ^a   Mathiot, D ^a  

^a UNIVERSITÉ DE STRASBOURG   (France)

Author keywords

Bi(CMOS) sensor; Integrated streak camera; Streak camera; Time resolved imaging

Indexed keywords

BICMOS TECHNOLOGY; IMAGE RESOLUTION; METALS; MICROMETERS; MOS DEVICES; OXIDE SEMICONDUCTORS; PHOTODETECTORS; PHOTONS; STREAK CAMERAS;

BIPOLAR COMPLEMENTARY METAL OXIDE SEMICONDUCTOR; FUNCTION OF TIME; OPTOELECTRONIC INSTRUMENTS; SPATIAL RESOLUTION; TEMPORAL RESOLUTION; TIME RESOLVED IMAGING; TUBELESS STREAK CAMERAS; ULTRA HIGH SPEED;

CMOS INTEGRATED CIRCUITS;

EID: 78149420770     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/21/11/115203     Document Type: Article

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