Single photon avalanche detectors in standard CMOS

Proceedings of IEEE Sensors

Volumn , Issue , 2007, Pages 585-588

  Dandin, Marc ^a   Nelson, Nicole ^a   Saveliev, Valeri ^a   Ji, Honghao ^a   Abshire, Pamela ^a   Weinberg, Irving ^b  

^a UNIVERSITY OF MARYLAND   (United States)

^b Fast Imaging Company   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BREAK DOWN VOLTAGES; CIRCULAR JUNCTIONS; CMOS TECHNOLOGIES; CONTROL GATES; DIODE STRUCTURES; GUARD RINGS; LATERAL DIFFUSIONS; ROOM TEMPERATURES; SINGLE PHOTON AVALANCHE DETECTORS; SINGLE PHOTONS; SURROUNDING REGIONS;

AVALANCHES (SNOWSLIDES); CMOS INTEGRATED CIRCUITS; DETECTORS; ELECTRIC CONDUCTIVITY; HETEROJUNCTION BIPOLAR TRANSISTORS; IONIZATION OF GASES; PARTICLE BEAMS; PHOTONS; POLYSILICON; SEMICONDUCTING SILICON COMPOUNDS; SENSORS; SNOW;

AVALANCHE DIODES;

EID: 48349145384     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSENS.2007.4388466     Document Type: Conference Paper

References (9)

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