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Applied Surface Science

Volumn 257, Issue 2, 2010, Pages 610-615

Hydrogen peroxide treatment on ZnO substrates to investigate the characteristics of Pt and Pt oxide Schottky contacts

(4) Tsai, Chia Hung a Hung, Chen I a Yang, Cheng Fu b Houng, Mau Phon a

a NATIONAL CHENG KUNG UNIVERSITY (Taiwan)

b NATIONAL UNIVERSITY OF KAOHSIUNG (Taiwan)

Author keywords

Hydrogen peroxide; Pt (oxide); Schottky barrier height; Schottky contact; ZnO

Indexed keywords

CAPACITANCE; HYDROGEN PEROXIDE; II-VI SEMICONDUCTORS; OXIDATION; PEROXIDES; PLATINUM COMPOUNDS; SCHOTTKY BARRIER DIODES; SPECTROMETERS; X RAY DIFFRACTION; ZINC OXIDE;

ELECTRICAL CHARACTERISTIC; GRAZING INCIDENCE X-RAY DIFFRACTION; HYDROGEN PEROXIDE TREATMENT; PHOTOLUMINESCENCE SPECTRUM; RECTIFYING CHARACTERISTICS; SCHOTTKY BARRIER HEIGHTS; SCHOTTKY CONTACTS; SECONDARY ION MASS SPECTROMETERS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 78049529168 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2010.07.043 Document Type: Article

Times cited : (16)

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