Charge-based scanning probe readback of nanometer-scale ferroelectric domain patterns at megahertz rates

Nanotechnology

Volumn 20, Issue 22, 2009, Pages

  Forrester, Martin G ^a   Ahner, Joachim W ^a   Bedillion, Mark D ^a   Bedoya, Cedric ^a   Bolten, Dierk G ^a   Chang, Kai Chieh ^a   De Gersem, Gudrun ^a   Hu, Shan ^a   Johns, Earl C ^a   Nassirou, Maissarath ^a   Palmer, Jason ^a   Roelofs, Andreas ^a   Siegert, Markus ^a   Tamaru, Shingo ^a   Vaithyanathan, Venugopalan ^a   Zavaliche, Florin ^a   Zhao, Tong ^a   Zhao, Yongjun ^a  

^a SEAGATE RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COERCIVE VOLTAGES; CONSTANT VOLTAGE; DATA STORAGE; FERROELECTRIC DOMAINS; NANO-METER-SCALE; ORDERS OF MAGNITUDE; RANDOM ACCESS MEMORIES; SCANNING PROBES; STORAGE SYSTEMS;

FERROELECTRICITY; PROBES; RANDOM ACCESS STORAGE; SCANNING;

FERROELECTRIC MATERIALS;

NANOFILM;

ARTICLE; ELECTRIC POTENTIAL; NANOTECHNOLOGY; PIEZOELECTRICITY; PRIORITY JOURNAL; TECHNIQUE;

EID: 67649188204     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/22/225501     Document Type: Article

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