Time-resolved opto-electronic properties of poly(3-hexylthiophene-2,5-diyl) : Fullerene heterostructures detected by Kelvin force microscopy

Thin Solid Films

Volumn 519, Issue 2, 2010, Pages 836-840

  Čermák, Jan ^a   Rezek, Bohuslav ^a   Cimrová, Věra ^b   Fejfar, Antonín ^a   Purkrt, Adam ^a,b,c   Vaněček, Milan ^a   Kočka, Jan ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b INSTITUTE OF MACROMOLECULAR CHEMISTRY   (Czech Republic)

^c CZECH TECHNICAL UNIVERSITY IN PRAGUE   (Czech Republic)

Author keywords

Atomic force microscopy; Bulk heterojunction; Kelvin force microscopy; Photovoltaics

Indexed keywords

AMBIENT CONDITIONS; BLEND FILMS; BULK HETEROJUNCTION; BUTYRIC ACIDS; CELL CHARACTERIZATION; CHARGE GENERATION; ELECTRON ACCEPTOR; ELECTRON ACCUMULATION; ELECTRON DONORS; FULLERENE DERIVATIVE; GLASS SUBSTRATES; HETEROSTRUCTURES; INDIUM TIN OXIDE; KELVIN FORCE MICROSCOPY; METAL CONTACTS; METHYL ESTERS; OPTO-ELECTRONICS; OPTOELECTRONIC PROPERTIES; ORGANIC MATERIALS; PHOTOINDUCED CHANGE; PHOTOVOLTAICS; TIME-PERIODS; TIME-RESOLVED;

ATOMIC FORCE MICROSCOPY; CARRIER MOBILITY; ELECTRONIC PROPERTIES; ESTERIFICATION; ESTERS; FATTY ACIDS; FULLERENES; HETEROJUNCTIONS; INDIUM COMPOUNDS; ITO GLASS; OXIDE FILMS; PHOTOVOLTAIC CELLS; PHOTOVOLTAIC EFFECTS; SPIN GLASS; SUBSTRATES; SURFACE POTENTIAL; SURFACE PROPERTIES; TIN; TIN OXIDES; TITANIUM COMPOUNDS;

POLYMER FILMS;

EID: 77958455503     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.08.132     Document Type: Article

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