SCOPUS 정보 검색 플랫폼

Volumn 1, Issue 5, 2007, Pages 193-195

Correlation of atomic force microscopy detecting local conductivity and micro-Raman spectroscopy on polymer-fullerene composite films

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; FULLERENES; MORPHOLOGY; RAMAN SPECTROSCOPY;

HETERO-JUNCTION COMPOSITE FILMS; KELVIN FORCE MICROSCOPY; MICRO-RAMAN MAPPING; PHOTOVOLTAIC PROPERTIES;

POLYMER MATRIX COMPOSITES;

EID: 38749111422 PISSN: 18626254 EISSN: 18626270 Source Type: Journal
DOI: 10.1002/pssr.200701131 Document Type: Article

Times cited : (16)

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