Concurrent test of network-on-chip interconnects and routers

LATW2010 - 11th Latin-American Test Workshop

Volumn , Issue , 2010, Pages

  Hervé, Marcos ^a   Almeida, Pedro ^a   Kastensmidt, Fernanda Lima ^a   Cota, Érika ^a   Lubaszewski, Marcelo ^a  

^a FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

CONCURRENT TEST; FAULT COVERAGES; INTERCONNECT FAULTS; NETWORK-ON-CHIP INTERCONNECTS; TEST METHOD; TEST SEQUENCE;

INTERCONNECTION NETWORKS; SERVERS; TESTING; VLSI CIRCUITS;

ROUTERS;

EID: 77958144397     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/LATW.2010.5550355     Document Type: Conference Paper

References (12)

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