Testing and diagnosis of interconnects using boundary scan architecture

Digest of Papers - International Test Conference

Volumn , Issue , 1988, Pages 126-137

  Hassan, Abu ^a   Rajski, Janusz ^a   Agarwal, Vinod K ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

LOGIC DEVICES--GATES; PRINTED CIRCUITS;

BOUNDARY SCAN ARCHITECTURE; BUILT-IN SELF-TEST; INTERCONNECTS;

AUTOMATIC TESTING;

EID: 0024121727     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)