Low temperature electrostatic force microscopy of a deep two-dimensional electron gas using a quartz tuning fork

Applied Physics Letters

Volumn 97, Issue 14, 2010, Pages

  Hedberg, J A ^a   Lal, A ^a   Miyahara, Y ^a   Grutter P ^a   Gervais, G ^a   Hilke, M ^a   Pfeiffer, L ^b   West, K W ^b  

^a MCGILL UNIVERSITY   (Canada)

^b Princeton University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITIVE COUPLINGS; CLEAVED EDGE OVERGROWTH; ELECTROSTATIC FORCE MICROSCOPY; ELECTROSTATIC POTENTIALS; FORCE SENSOR; HIGH MAGNETIC FIELDS; LOW TEMPERATURES; QUARTZ TUNING FORK; SCANNING PROBE MICROSCOPE; SEPARATION DISTANCES; SHUBNIKOV-DE HAAS OSCILLATIONS; TWO-DIMENSIONAL ELECTRON GAS (2DEG); ULTRA LOW TEMPERATURES;

ELECTRIC FORCE MICROSCOPY; ELECTRIC POTENTIAL; ELECTRON GAS; ELECTROSTATIC FORCE; MAGNETIC FIELDS; QUARTZ; TUNING; TWO DIMENSIONAL;

TWO DIMENSIONAL ELECTRON GAS;

EID: 77958060670     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3499293     Document Type: Article

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