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Volumn 249-251, Issue , 1998, Pages 79-83
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Scanned potential microscopy of a two-dimensional electron gas
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Author keywords
Atomic force; Quantum Hall effect; Voltage microscopy
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
QUANTUM THEORY;
VOLTAGE DISTRIBUTION MEASUREMENT;
MESOSCOPIC SYSTEM;
QUANTUM HALL CONDUCTOR;
SCANNED POTENTIAL MICROSCOPY;
TWO DIMENSIONAL ELECTRON GAS;
HALL EFFECT;
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EID: 0032094182
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4526(98)00071-4 Document Type: Article |
Times cited : (6)
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References (19)
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