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Volumn 249-251, Issue , 1998, Pages 79-83

Scanned potential microscopy of a two-dimensional electron gas

Author keywords

Atomic force; Quantum Hall effect; Voltage microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; QUANTUM THEORY; VOLTAGE DISTRIBUTION MEASUREMENT;

EID: 0032094182     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(98)00071-4     Document Type: Article
Times cited : (6)

References (19)
  • 17
    • 1842337502 scopus 로고    scopus 로고
    • M.J. Yoo et al. Science 276 (1997) 579.
    • (1997) Science , vol.276 , pp. 579
    • Yoo, M.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.