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Volumn 6, Issue 1, 2000, Pages 238-241

Scanned potential microscopy of edge states in a quantum Hall liquid

Author keywords

[No Author keywords available]

Indexed keywords

HALL EFFECT; MICROSCOPIC EXAMINATION; PERTURBATION TECHNIQUES; VOLTAGE MEASUREMENT;

EID: 0034138782     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1386-9477(99)00115-0     Document Type: Article
Times cited : (6)

References (28)
  • 8
    • 0001693353 scopus 로고
    • Komiyama et al., Phys. Rev. B 40 (1989) 12 566.
    • (1989) Phys. Rev. B , vol.40 , pp. 12566
    • Komiyama1
  • 25
    • 1842337502 scopus 로고    scopus 로고
    • Yoo M.J.et al. Science. 276:1997;579.
    • (1997) Science , vol.276 , pp. 579
    • Yoo, M.J.1
  • 27
    • 85031565278 scopus 로고    scopus 로고
    • Ph.D. Thesis, University of California, Berkeley
    • K.L. McCormick, Ph.D. Thesis, University of California, Berkeley, 1998.
    • (1998)
    • McCormick, K.L.1
  • 28
    • 0001358248 scopus 로고
    • Komiyama et al., Phys. Rev. B 45 (1992) 11 085.
    • (1992) Phys. Rev. B , vol.45 , pp. 11085
    • Komiyama1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.