SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 604, Issue 19-20, 2010, Pages 1825-1831

Scanning tunneling microscopy and spectroscopy of the semi-insulating CdZnTe(110) surface

(3) Egan, C K a Choubey, A a Brinkman, A W a

a DURHAM UNIVERSITY (United Kingdom)

Author keywords

CdTe; CdZnTe; Semi insulating; STM; STS

Indexed keywords

CADMIUM ALLOYS; ELECTRIC RECTIFIERS; ELECTRONIC STRUCTURE; INSULATION; SCANNING TUNNELING MICROSCOPY;

CDTE; CDZNTE; NEGATIVE SAMPLE BIAS; SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY; SEMI-INSULATING; SEMI-INSULATING MATERIALS; TUNNEL CURRENTS; TUNNELING SPECTRA;

SURFACE DEFECTS;

EID: 77958047407 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2010.07.014 Document Type: Article

Times cited : (4)

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