-
4
-
-
30544432038
-
-
H. Mimura, S. Matsuyama, H. Yumoto, H. Hara, K. Yamamura, Y. Sano, M. Shibahara, K. End, Y. Mori, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and K. Yamauchi Jpn. J. Appl. Phys. Part 2-Lett. Express Lett. 44 2005 L539
-
(2005)
Jpn. J. Appl. Phys. Part 2-Lett. Express Lett.
, vol.44
, pp. 539
-
-
Mimura, H.1
Matsuyama, S.2
Yumoto, H.3
Hara, H.4
Yamamura, K.5
Sano, Y.6
Shibahara, M.7
End, K.8
Mori, Y.9
Nishino, Y.10
Tamasaku, K.11
Yabashi, M.12
Ishikawa, T.13
Yamauchi, K.14
-
5
-
-
77957926818
-
-
C.G. Schroer, B. Benner, M. Kuhlmann, O. Kurapova, B. Lengeler, F. Zontone, A. Snigirev, I. Snigireva, and H. Schulte-Schrepping S.G. Biedron, W. Eberhardt, T. Ishikawa, R.O. Tatchyn, 2004 SPIE Denver, CO, USA 116 124
-
(2004)
SPIE
, pp. 116-124
-
-
Schroer, C.G.1
Benner, B.2
Kuhlmann, M.3
Kurapova, O.4
Lengeler, B.5
Zontone, F.6
Snigirev, A.7
Snigireva, I.8
Schulte-Schrepping, H.9
Biedron, S.G.10
Eberhardt, W.11
Ishikawa, T.12
Tatchyn, R.O.13
-
6
-
-
69749086855
-
-
J. Vila-Comamala, K. Jefimovs, J. Raabe, T. Pilvi, R.H. Fink, M. Senoner, A. Maassdorf, M. Ritala, and C. David Ultramicroscopy 109 2009 1360
-
(2009)
Ultramicroscopy
, vol.109
, pp. 1360
-
-
Vila-Comamala, J.1
Jefimovs, K.2
Raabe, J.3
Pilvi, T.4
Fink, R.H.5
Senoner, M.6
Maassdorf, A.7
Ritala, M.8
David, C.9
-
7
-
-
70349665354
-
-
W. Chao, J. Kim, S. Rekawa, P. Fischer, and E.H. Anderson Opt. Express 17 2009 17669
-
(2009)
Opt. Express
, vol.17
, pp. 17669
-
-
Chao, W.1
Kim, J.2
Rekawa, S.3
Fischer, P.4
Anderson, E.H.5
-
8
-
-
77957888740
-
-
J. Reinspach, M. Lindblom, O. von Hofsten, M. Bertilson, Hans M. Hertz, A. Holmberg, AVS (2009) 2593.
-
(2009)
AVS
, pp. 2593
-
-
Reinspach, J.1
Lindblom, M.2
Von Hofsten, O.3
Bertilson, M.4
Hertz, H.M.5
Holmberg, A.6
-
9
-
-
33845186032
-
-
H.N. Chapman, A. Barty, M.J. Bogan, S. Boutet, M. Frank, S.P. Hau-Riege, S. Marchesini, B.W. Woods, S. Bajt, H. Benner, R.A. London, E. Plonjes, M. Kuhlmann, R. Treusch, S. Dusterer, T. Tschentscher, J.R. Schneider, E. Spiller, T. Moller, C. Bostedt, M. Hoener, D.A. Shapiro, K.O. Hodgson, D. Van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M.M. Seibert, F.R.N.C. Maia, R.W. Lee, A. Szoke, N. Timneanu, and J. Hajdu Nat. Phys. 2 2006 839
-
(2006)
Nat. Phys.
, vol.2
, pp. 839
-
-
Chapman, H.N.1
Barty, A.2
Bogan, M.J.3
Boutet, S.4
Frank, M.5
Hau-Riege, S.P.6
Marchesini, S.7
Woods, B.W.8
Bajt, S.9
Benner, H.10
London, R.A.11
Plonjes, E.12
Kuhlmann, M.13
Treusch, R.14
Dusterer, S.15
Tschentscher, T.16
Schneider, J.R.17
Spiller, E.18
Moller, T.19
Bostedt, C.20
Hoener, M.21
Shapiro, D.A.22
Hodgson, K.O.23
Van Der Spoel, D.24
Burmeister, F.25
Bergh, M.26
Caleman, C.27
Huldt, G.28
Seibert, M.M.29
Maia, F.R.N.C.30
Lee, R.W.31
Szoke, A.32
Timneanu, N.33
Hajdu, J.34
more..
-
10
-
-
77957923519
-
-
T. Nisius, R. Fruke, D. Schafer, M. Wieland, and T. Wilhein L. Juha, S. Bajt, R. Sobierajski, 73610Y 2009 SPIE Prague, Czech Republic
-
(2009)
SPIE
-
-
Nisius, T.1
Fruke, R.2
Schafer, D.3
Wieland, M.4
Wilhein, T.5
-
13
-
-
51349139918
-
-
Y.T. Chen, T.N. Lo, Y.S. Chu, J. Yi, C.J. Liu, J.Y. Wang, C.L. Wang, C.W. Chiu, T.E. Hua, Y. Hwu, Q. Shen, G.C. Yin, K.S. Liang, H.M. Lin, J.H. Je, and G. Margaritondo Nanotechnology 19 2008 395302
-
(2008)
Nanotechnology
, vol.19
, pp. 395302
-
-
Chen, Y.T.1
Lo, T.N.2
Chu, Y.S.3
Yi, J.4
Liu, C.J.5
Wang, J.Y.6
Wang, C.L.7
Chiu, C.W.8
Hua, T.E.9
Hwu, Y.10
Shen, Q.11
Yin, G.C.12
Liang, K.S.13
Lin, H.M.14
Je, J.H.15
Margaritondo, G.16
-
15
-
-
37149048102
-
-
Y. Feng, M. Feser, A. Lyon, S. Rishton, X. Zeng, S. Chen, S. Sassolini, and W. Yun J. Vac. Sci. Technol. B 25 2007 2004
-
(2007)
J. Vac. Sci. Technol. B
, vol.25
, pp. 2004
-
-
Feng, Y.1
Feser, M.2
Lyon, A.3
Rishton, S.4
Zeng, X.5
Chen, S.6
Sassolini, S.7
Yun, W.8
-
16
-
-
0031069256
-
-
A. Ozawa, T. Tamamura, T. Ishii, H. Yoshihara, and T. Kagoshima Microelectron. Eng. 35 1997 525
-
(1997)
Microelectron. Eng.
, vol.35
, pp. 525
-
-
Ozawa, A.1
Tamamura, T.2
Ishii, T.3
Yoshihara, H.4
Kagoshima, T.5
-
17
-
-
37749000911
-
-
K. Jefimovs, J. Vila-Comamala, T. Pilvi, J. Raabe, M. Ritala, and C. David Phys. Rev. Lett. 99 2007 264801
-
(2007)
Phys. Rev. Lett.
, vol.99
, pp. 264801
-
-
Jefimovs, K.1
Vila-Comamala, J.2
Pilvi, T.3
Raabe, J.4
Ritala, M.5
David, C.6
-
19
-
-
44149123134
-
-
J. Vila-Comamala, K. Jefimovs, J. Raabe, B. Kaulich, and C. David Microelectron. Eng. 85 2008 1241
-
(2008)
Microelectron. Eng.
, vol.85
, pp. 1241
-
-
Vila-Comamala, J.1
Jefimovs, K.2
Raabe, J.3
Kaulich, B.4
David, C.5
-
21
-
-
0035763303
-
-
R.A. London, R. Bionta, R. Tatchyn, and S. Roessler R. Tatchyn, K.F. Andreas, T. Matsushita, Optics for Fourth-Generation X-Ray Sources 2001 SPIE Press San Diego, USA 51 62
-
(2001)
Optics for Fourth-Generation X-Ray Sources
, pp. 51-62
-
-
London, R.A.1
Bionta, R.2
Tatchyn, R.3
Roessler, S.4
-
22
-
-
34248579010
-
-
S.P. Hau-Riege, R.A. London, R.M. Bionta, M.A. McKernan, S.L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J.B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau Appl. Phys. Lett. 90 2007 173128
-
(2007)
Appl. Phys. Lett.
, vol.90
, pp. 173128
-
-
Hau-Riege, S.P.1
London, R.A.2
Bionta, R.M.3
McKernan, M.A.4
Baker, S.L.5
Krzywinski, J.6
Sobierajski, R.7
Nietubyc, R.8
Pelka, J.B.9
Jurek, M.10
Juha, L.11
Chalupsky, J.12
Cihelka, J.13
Hajkova, V.14
Velyhan, A.15
Krasa, J.16
Kuba, J.17
Tiedtke, K.18
Toleikis, S.19
Tschentscher, T.20
Wabnitz, H.21
Bergh, M.22
Caleman, C.23
Sokolowski-Tinten, K.24
Stojanovic, N.25
Zastrau, U.26
more..
-
25
-
-
77957920729
-
-
http://www.diamond-materials.com/downloads/cvd-diamond-booklet.pdf
-
-
-
|