메뉴 건너뛰기




Volumn 43, Issue 19, 2010, Pages 8153-8161

Probing the chain and crystal lattice orientation in polyethylene thin films by near edge X-ray absorption fine structure (NEXAFS) spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL UNIT CELL; ELECTRON YIELD; FILM PLANES; HIGH SPATIAL RESOLUTION; ISOTHERMAL CRYSTALLIZATION; LAMELLAR MORPHOLOGY; LATTICE ORIENTATIONS; LENGTH SCALE; MICA SUBSTRATES; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPIES; ORTHORHOMBIC UNIT CELL; POLYETHYLENE THIN FILMS; POLYMER THIN FILMS; SILICON SUBSTRATES;

EID: 77957814659     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma101213h     Document Type: Article
Times cited : (13)

References (51)
  • 40
    • 0004237782 scopus 로고
    • Springer-Verlag: Berlin, Heidelberg
    • Stöhr, J. NEXAFS Spectroscopy; Springer-Verlag: Berlin, Heidelberg, 1992.
    • (1992) NEXAFS Spectroscopy
    • Stöhr, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.